Image symmetry for dip determination
US9619731B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2014 |
| Grant date | Apr 11, 2017 |
| Priority date | — |
| Expiry date | Apr 8, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30181
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods for dip determination from an image obtained by a down-hole imaging tool. For each pixel forming the image, a probability that a symmetry axis coincides with the pixel is determined. A probability map is then generated, depicting the determined probability of each pixel coinciding with the symmetry axis. The probability map and the image are then superposed to generate a mapped image. The symmetry axis is then estimated based on the mapped image. Image pixels coinciding with a boundary of the geologic feature are then selected in multiple depth zones, and a segment of a sinusoid is fitted to the selected image pixels within each depth zone. Dip within each of the depth zones is then determined based on the fitted sinusoid segments therein.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.