Patent · US Active

Epitaxial wafer manufacturing device and manufacturing method

US9624602B2 · kind B2 · utility

1Cited by
0References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 3, 2012
Grant dateApr 18, 2017
Priority date
Expiry dateJun 7, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02529
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

An epitaxial wafer manufacturing device, including a shield (12), which in addition to being removably attached inside a chamber, is arranged in close proximity to the lower surface of a top plate (3). The shield has a substrate (12a) having an opening (13) in the central portion thereof that forces a gas inlet (9) to face the inside of a reaction space (K), and a thin film (12b) that covers the lower surface of the substrate. The surface of the thin film has the shape of surface irregularities corresponding to fine surface irregularities formed in the lower surface of the substrate. When the shield has undergone thermal deformation as a result of being heated by heating means (8), deposits deposited on the lower surface of the shield are inhibited from falling off by the shape of the surface irregularities.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.