Patent · US Active

Memory device for performing error correction code operation and redundancy repair operation

US9626244B2 · kind B2 · utility

10Cited by
14References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 13, 2014
Grant dateApr 18, 2017
Priority date
Expiry dateMar 28, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/1208
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Provided are a memory device and a memory module, which perform both an ECC operation and a redundancy repair operation. The memory device repairs a single-bit error due to a ‘fail’ cell by using an error correction code (ECC) operation, and also repairs the ‘fail’ cell by using a redundancy repair operation when the ‘fail’ cell is not repairable by the ECC operation. The redundancy repair operation includes a data line repair and a block repair. The ECC operation may change a codeword corresponding to data per one unit of memory cells including the ‘fail’ cell, and may also change the size of parity bits regarding the changed codeword.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.