Patent · US Active

Analysis device, analysis method, and program

US9626631B2 · kind B2 · utility

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0References
18Claims
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Assignee

Inventors

Key dates

Filing dateJun 3, 2015
Grant dateApr 18, 2017
Priority date
Expiry dateJul 21, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/15
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An analysis device which analyzes a system that inputs input data including a plurality of input parameters and outputs output data, including an acquisition unit that acquires learning data including a plurality of sets of the input data and the output data, and a learning processing unit that learns, based on the acquired learning data, the amount of difference of output data corresponding to a difference between input parameters of two pieces of input data, an analysis method using the analysis device, and a program used in the analysis device are provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.