System for eye examination by means of stress-dependent parameters
US9629537B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2015 |
| Grant date | Apr 25, 2017 |
| Priority date | — |
| Expiry date | Dec 11, 2035 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2090/3735
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The present disclosure relates to a system for examining an eye. The system comprises a microscopy system for generating an image plane image of an object region. An OCT system of the system is configured to acquire OCT data from the object region which reproduce the object region in different stress states. A data processing unit of the system is configured to determine at least one value of a stress-dependent parameter, depending on the OCT data. The system generates an output image that is dependent on the image plane image and is furthermore dependent on the stress-dependent parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.