Patent · US Active

System for eye examination by means of stress-dependent parameters

US9629537B2 · kind B2 · utility

8Cited by
0References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 11, 2015
Grant dateApr 25, 2017
Priority date
Expiry dateDec 11, 2035

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B2090/3735
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

The present disclosure relates to a system for examining an eye. The system comprises a microscopy system for generating an image plane image of an object region. An OCT system of the system is configured to acquire OCT data from the object region which reproduce the object region in different stress states. A data processing unit of the system is configured to determine at least one value of a stress-dependent parameter, depending on the OCT data. The system generates an output image that is dependent on the image plane image and is furthermore dependent on the stress-dependent parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.