Systems and methods for electronic stress analysis comparison
US9633141B2 · kind B2 · utility
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6References
11Claims
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Key dates
| Filing date | May 9, 2013 |
| Grant date | Apr 25, 2017 |
| Priority date | — |
| Expiry date | Feb 9, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/14
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Electronic comparison methods are described for determining changes in a current design model with respect to an earlier model and analyzing the impact of the identified changes. The method includes associating a priority value with a set of modified component objects using one or more algorithms and presenting a subset of the set of component objects, each of which has a priority value greater than a threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.