Patent · US Active

Chemical mechanical polishing composition for polishing a sapphire surface and methods of using same

US9633831B2 · kind B2 · utility

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2Claims
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Key dates

Filing dateAug 26, 2013
Grant dateApr 25, 2017
Priority date
Expiry dateJan 30, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0242
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of polishing a sapphire substrate is provided, comprising: providing a substrate having an exposed sapphire surface; providing a chemical mechanical polishing slurry, wherein the chemical mechanical polishing slurry comprises, as initial components: colloidal silica abrasive, wherein the colloidal silica abrasive has a negative surface charge; and, wherein the colloidal silica abrasive exhibits a multimodal particle size distribution with a first particle size maximum between 2 and 25 nm; and, a second particle size maximum between 75 and 200 nm; optionally, a biocide; optionally, a nonionic defoaming agent; and, optionally, a pH adjuster. A chemical mechanical polishing composition for polishing an exposed sapphire surface is also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.