Patent · US Active

System for deforming and analyzing particles

US9638620B2 · kind B2 · utility

27Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 17, 2015
Grant dateMay 2, 2017
Priority date
Expiry dateJul 17, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T7/0016
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for deforming and analyzing a plurality of particles carried in a sample volume includes a substrate defining an inlet, configured to receive the sample volume, and an outlet; and a fluidic pathway fluidly coupled to the inlet and the outlet. The fluidic pathway includes a delivery region configured to receive the plurality of particles from the inlet and focus the plurality of particles from a random distribution to a focused state, a deformation region defining an intersection located downstream of the delivery region and coupled to the outlet, and wherein the deformation region is configured to receive the plurality of particles from the delivery region and to transmit each particle in the plurality of particles into the intersection from a single direction, a first branch fluidly coupled to the deformation region and configured to transmit a first flow into the intersection, and a second branch fluidly coupled to the deformation region and configured to transmit a second flow, substantially opposing the first flow, into the intersection, wherein the first flow and the second flow are configured to induce extension of one or more particles in the plurality of particles.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.