Systems and methods for flaw scan with interleaved sectors
US9640217B1 · kind B1 · utility
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1References
20Claims
0Family size
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Key dates
| Filing date | Nov 30, 2015 |
| Grant date | May 2, 2017 |
| Priority date | — |
| Expiry date | Nov 30, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2020/1281
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods relating generally to determining flaws on a storage medium.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.