Method and system for platform-based device field tests
US9642027B2 · kind B2 · utility
2Cited by
1References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 2, 2014 |
| Grant date | May 2, 2017 |
| Priority date | — |
| Expiry date | Sep 7, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W64/006
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
An approach for receiving an input for specifying one or more parameters for evaluating a device under testing. The approach further involves generating a test route based on the input, wherein the test route represents a test environment in which the device under testing is expected to be subjected to the one or more parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.