Method of measuring an object

US9644945B2 · kind B2 · utility

Assignee

• SICK AG · DE

Inventors

• Achim Nubling · Emmendingen, DE
• Thorsten Harter · Ortenberg, DE
• Carsten Ehrler · Glückstadt, DE

Key dates

• Filing date: Jul 8, 2015
• Grant date: May 9, 2017
• Expiry date: Sep 3, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01S17/87
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method of measuring an object by means of at least one first laser scanner is described which detects measured values for a plurality of measurement points, wherein only measured values which lie above a predefined threshold value are used for measuring the object. The method is characterized in that threshold values are determined separately for at least two ranges of measurement points of the laser scanner or laser scanners and the threshold value used for a measurement point is selected in dependence on a quality criterion.