Patent · US Active

Measurement of dynamic material properties

US9645064B1 · kind B1 · utility

4Cited by
19References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 9, 2015
Grant dateMay 9, 2017
Priority date
Expiry dateNov 5, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N3/303
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An example method includes positioning a mass at a height opposite a modulator characterized by a particular strain rate and support by a carrier moveably disposed opposite the mass. The method also includes releasing the mass such that the mass impacts the modulator, and an additional component connected to the carrier causes failure of a sample of material. The method further includes determining a displacement of the carrier corresponding to failure of the sample, determining a force applied to the modulator by the mass and resulting in failure of the sample, and determining at least one of a dynamic strength of the sample and a dynamic modulus of the sample. In such a method, the dynamic strength is based on the force applied to the modulator and the strain rate. Additionally, the dynamic modulus is based on the displacement of the carrier and the strain rate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.