System and method using OAM spectroscopy leveraging fractional orbital angular momentum as signature to detect materials
US9645083B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 10, 2016 |
| Grant date | May 9, 2017 |
| Priority date | — |
| Expiry date | Nov 10, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/3692
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus detects a material within a sample and includes signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first beam to the sample. The orbital angular momentum imparts a phase factor of exp(imφ), where m is at least one of an integer value or fractional value and φ is the azimuth angle, to the first light beam. A detector receives the first light beam after the first light beam passes through the sample and detects the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.