Patent · US Active

Determination of a measuring sequence for a magnetic resonance system

US9645216B2 · kind B2 · utility

3Cited by

4References

20Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Björn Heismann · Erlangen, DE
Mathias Nittka · Baiersdorf, DE
Peter Speier · Erlangen, DE
Aurélien Stalder · Erlangen, DE

Key dates

Filing date	Feb 1, 2013
Grant date	May 9, 2017
Priority date	—
Expiry date	Mar 12, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/56518
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and a measuring-sequence-determining device for determining a measuring sequence for a magnetic resonance system based on at least one intra-repetition-interval time parameter are provided. During the determination of the measuring sequence in a gradient-optimization method, gradient-pulse parameters of the measuring sequence are automatically optimized to reduce at least one gradient-pulse-parameter maximum value. As a boundary condition in the gradient-optimization method, the intra-repetition-interval time parameter is kept constant at least within a specified tolerance value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.