Method and apparatus for testing a sensor
US9651575B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 25, 2013 |
| Grant date | May 16, 2017 |
| Priority date | — |
| Expiry date | Aug 6, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is a testing device for testing a sensor. The testing device includes a rotating mechanism; a first rotating plate connected to the rotating mechanism so that the first rotating plate rotates around an orbital axis (Z1); a second plate rotatably attached to the first rotating plate at a rotating point, the second plate having a rotational axis (Z2) offset from the orbital axis (Z1) by a predetermined distance R; and a gripping mechanism attached to the second plate and configured to receive and fix the sensor relative to the second plate. The second plate follows a circular trajectory with constant attitude around the orbital axis (Z1).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.