Metrology management

US9652729B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• William K. Hoffman · Pleasant Valley, US
• Timothy L. Holmes · Newburgh, US
• Jonathan Levy · Great Neck, US
• Christopher E. Pepe · Montgomery, US
• Darryl D. Restaino · Modena, US
• Eric P. Solecky · Hyde Park, US
• Roger M. Young · Monroe, US

Key dates

• Filing date: Oct 27, 2011
• Grant date: May 16, 2017
• Expiry date: Jul 14, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G06Q10/06395
• WIPO field: IT methods for management
• WIPO sector: Electrical engineering

Abstract

A method for managing a metrology system includes receiving a part, identifying, with a processing device, a part type associated with the part, retrieving, with the processing device, test rule logic associated with the part type from a database, retrieving, with the processing device, measurement data associated with the identified part type, processing, with the processing device, the measurement data, applying, with the processing device, the test rule logic to the processed measurement data to determine whether the part should be measured, outputting the part responsive to determining that the part should not be measured, and incrementing, with the processing device, a counter and saving a value of the counter in the database responsive to outputting the part responsive to determining that the part should not be measured.