Method, apparatus and equipment of inspecting quality of LCD
US9652842B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 10, 2013 |
| Grant date | May 16, 2017 |
| Priority date | — |
| Expiry date | Mar 23, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, an apparatus and an equipment of inspecting the quality of an LCD are provided, the method includes: obtaining optical parameters of the LCD; capturing images of the LCD; and determining that the LCD is defective after determining that the optical parameters are not in the range of the preset optical parameters and/or the captured images of the LCD are not consistent with the pre-stored images. Through the technical solution of the present invention, it can effectively differentiate the defect types of a product and record the defect position of the product, thereby it can effectively reduce misjudgment or miss test caused by the visual differences between operators to improve the quality and yield of manufactured LCD.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.