Microprocessor-assisted calibration for analog-to-digital converter
US9654133B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 1, 2015 |
| Grant date | May 16, 2017 |
| Priority date | — |
| Expiry date | Dec 1, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1215
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Analog-to-digital converters (ADCs) can have errors which can affect their performance. To improve the performance, many techniques have been used to compensate or correct for the errors. When the ADCs are being implemented with sub-micron technology, ADCs can be readily and easily equipped with an on-chip microprocessor for performing a variety of digital functions. The on-chip microprocessor and any suitable digital circuitry can implement functions for reducing those errors, enabling certain undesirable artifacts to be reduced, and providing a flexible platform for a highly configurable ADC. The on-chip microprocessor is particularly useful for a randomized time-interleaved ADC. Moreover, a randomly sampling ADC can be added in parallel to a main ADC for calibration purposes. Furthermore, the overall system can include an efficient implementation for correcting errors in an ADC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.