Systems and methods for metal artifact reduction
US9655580B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 23, 2015 |
| Grant date | May 23, 2017 |
| Priority date | — |
| Expiry date | Dec 14, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/408
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method includes receiving, with at least one processor, a first projection dataset corresponding to X-rays at a first energy level projected towards a subject at a first set of view angles and receiving, with the at least one processor, a second projection dataset corresponding to X-rays at a second energy level projected towards the subject at a second set of view angles. The method further includes identifying, with the at least one processor, a metal trace from at least one of the first projection dataset and the second projection dataset. Moreover, the method includes converting, with the at least one processor, at least a portion of the first projection dataset to a pseudo dataset at the second energy level. The method also includes generating, with the at least one processor, a final image of the subject based on the second projection dataset, the pseudo dataset, and the metal trace.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.