Measuring device having a scanning functionality and a single-point measurement mode
US9658059B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2013 |
| Grant date | May 23, 2017 |
| Priority date | — |
| Expiry date | Mar 13, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S7/4817
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments described herein relate to a measuring device, comprising a base that defines a vertical axis, an assembly that can be pivoted about the vertical axis relative to the base, and a beam deflecting unit for varying the orientation of a measurement axis, wherein the beam deflecting unit can be rotated about a horizontal axis relative to the assembly. The measuring device further has a distance measurement functionality for measuring distance by means of the measurement radiation, an angle measurement functionality for determining an orientation of the measurement axis relative to the base, a control and processing unit for processing data and for controlling the measuring device, and a scanning functionality, wherein when the scanning functionality is executed, a scan is performed, and a point cloud comprising the scan points is produced. The assembly also has an imaging system. The measuring device may have a single-point measurement mode.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.