Patent · US Active

Microbolometer contact systems and methods

US9658111B2 · kind B2 · utility

1Cited by
21References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 11, 2015
Grant dateMay 23, 2017
Priority date
Expiry dateMay 11, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2005/0077
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

Systems and methods are directed to contacts for an infrared detector. For example, an infrared imaging device includes a substrate having a first metal layer and an infrared detector array coupled to the substrate via a plurality of contacts. Each contact includes for an embodiment a plurality of metal studs each having a first end and a second end and each disposed between the first metal layer and a second metal layer, wherein the first end of each metal stud is disposed on a portion of the first metal layer that is at least partially on the surface of the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.