Methods and devices for detection of analytes using bloch surface wave-enhanced diffraction-based sensors
US9658221B2 · kind B2 · utility
1Cited by
11References
32Claims
0Family size
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Key dates
| Filing date | Aug 28, 2009 |
| Grant date | May 23, 2017 |
| Priority date | — |
| Expiry date | Oct 10, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/552
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention features methods and diffraction-based devices for the detection of specific analytes. The devices of the invention contain a periodic dielectric multilayer, which allows for the propagation of Bloch surface waves (BSWs) at the surface of the multilayer, thereby increasing the sensitivity of the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.