System analysis device, system analysis method and system analysis program
US9658916B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 29, 2014 |
| Grant date | May 23, 2017 |
| Priority date | — |
| Expiry date | May 29, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system analysis device 100 includes a whole model generation unit 1021 which generates a whole model which is obtained by modeling elements or whole of a system and which includes a plurality of partial models, a core model generation unit 1023 which extracts, from a plurality of whole models generated on the basis of the same event, the partial models whose prediction precision satisfies a predetermined criteria, and generates a core model by integrating the extracted partial models, and a threshold setting unit 1024 which calculates a distance between the core model and the plurality of whole models using a predetermined definition, and outputs the distance as a threshold value for error determination using the core model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.