Light-microscopy method for locating point objects
US9665940B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 24, 2014 |
| Grant date | May 30, 2017 |
| Priority date | — |
| Expiry date | Jun 4, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30204
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A light-microscopy method for locating point objects in a sample arranged in an object space includes imaging the sample onto a detector by an imaging optical unit having a depth of field of predetermined axial extent along an optical axis in the object space, onto which the detector is imaged. The point objects in the sample are located within the depth of field. The first sample image generated by the imaging of the sample onto the detector is evaluated. For locating a respective first point object in a direction of the optical axis, a parameter of a first light spot of one or more light spots of the first sample image representing the first point object is determined, and a rough axial z position related to the first point object is assigned to the parameter based on predetermined association information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.