Auto program and auto cycling method for non-volatile memory
US9666291B2 · kind B2 · utility
2Cited by
5References
7Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 22, 2014 |
| Grant date | May 30, 2017 |
| Priority date | — |
| Expiry date | May 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/36
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a memory test method including receiving a memory test command, receiving pattern information for generating a data pattern to be written in a memory cell, and programming the memory cell according to the pattern information. According to this method, it is not required to receive external data to be programmed in a cell array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.