Patent · US Active

Imaging monitoring method and apparatus for fabricating three dimensional models

US9669584B2 · kind B2 · utility

0Cited by
11References
9Claims
0Family size

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Key dates

Filing dateJun 7, 2013
Grant dateJun 6, 2017
Priority date
Expiry dateSep 19, 2035

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB33Y40/20
  • WIPO fieldOther special machines
  • WIPO sectorMechanical engineering

Abstract

An imaging monitoring system and method for the establishment, monitoring and control of the positions, orientations and operational tolerances of and between the elements of an apparatus for fabricating three dimensional models from successive layers of model and sacrificial materials by capturing and analyzing images of a test patterns created on test surfaces of a three dimension model and elements of a system for fabricating three dimensional models.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.