Built in test circuit for transient voltage suppressor devices
US9671453B2 · kind B2 · utility
3Cited by
3References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 1, 2014 |
| Grant date | Jun 6, 2017 |
| Priority date | — |
| Expiry date | Jan 10, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH02H9/041
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A built-in test system includes a control circuit, a transient voltage suppressor circuit, and a test switch. The control circuit is configured to receive a signal, and the transient voltage suppressor circuit includes first and second transient voltage suppressors connected in series between the signal and ground. The test switch is connected to selectively conduct current between the signal and a node between the first and second transient voltage suppressors. The control circuit is configured to control the test switch to test the first and second transient voltage suppressors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.