Patent · US Active

Devices, systems, and methods for non-destructive testing of materials and structures

US9678045B2 · kind B2 · utility

2Cited by

9References

38Claims

0Family size

Assignee

The Board of Regents of the University of Texas System · US

Inventors

Jinying Zhu · Beijing, CN
Michael Haberman · Austin, US
Xiaowei Dai · Beijing, CN

Key dates

Filing date	Aug 30, 2013
Grant date	Jun 13, 2017
Priority date	—
Expiry date	May 19, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG10K15/06
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Provided are devices, systems, and methods for the testing of materials and structures. For example, the devices, systems, and methods are optionally used for the non-destructive testing of a material or structure. Furthermore, the devices, systems, and methods may optionally use a high-amplitude, air-coupled acoustic source for non-destructive testing of materials and structures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.