Scattered light reference pixel
US9678200B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 12, 2014 |
| Grant date | Jun 13, 2017 |
| Priority date | — |
| Expiry date | Aug 12, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an apparatus for determining an intensity and/or a phase of intensity modulation of an intensity-modulated electromagnetic radiation signal, having a detector and imaging optics for imaging an intensity-modulated radiation signal onto the detector. In comparison with this, the present invention addresses the problem of providing an apparatus for reducing scattered light influences on an intensity and/or phase determination of the intensity modulation of an intensity-modulated electromagnetic radiation signal. In order to solve this problem, the invention proposes configuring the apparatus of the type mentioned at the outset in such a manner that said apparatus has at least one scattered light reference pixel, which is arranged outside an imaging section of the imaging optics and is set up in such a manner that said pixel records measured values for an intensity-modulated scattered light signal during operation, and a determination device which is set up in such a manner that said determination device processes measured values from at least one pixel in a pixel matrix of the detector inside the imaging section as a first data input and measured value…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.