Patent · US Active

SiC epitaxial wafer and method for manufacturing the same

US9679767B2 · kind B2 · utility

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7Claims
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Assignee

Inventors

Key dates

Filing dateJun 19, 2013
Grant dateJun 13, 2017
Priority date
Expiry dateOct 9, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L22/12
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Provided is a method of manufacturing a SiC epitaxial wafer including a SiC epitaxial layer on a SiC substrate using a SiC-CVD furnace which is installed in a glove box. The method includes a SiC substrate placement step of placing the SiC substrate in the SiC-CVD furnace while circulating gas in the glove box.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.