Background calibration of sampler offsets in analog to digital converters
US9680489B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2016 |
| Grant date | Jun 13, 2017 |
| Priority date | — |
| Expiry date | Sep 29, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/361
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method for background calibration of sampler offsets in an Analog to Digital Converter (ADC), according to which one of the samplers of the ADC is established as a reference sampler, whose threshold and timing offsets will be the criterion for adjusting threshold offsets and timing offsets of all other samplers. Then each of the other samplers of the ADC, one at a time, is calibrated by selecting an uncalibrated sampler and establishing it as the current Sampler Under Calibration (SUC); disregarding contribution of the SUC to the output of the ADC; adjusting the threshold of the SUC to be identical to the threshold of the reference sampler; performing one-bit cross-correlation between the reference sampler and the SUC; establishing an error surface representing the threshold offset and timing offset of the SUC with respect to the reference sampler; adjusting the threshold and the timing of the SUC to be equal to the threshold and timing of the reference sampler; restoring level of the SUC to its original threshold with respect to the overall ADC and restoring contribution of the SUC to the output of the ADC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.