Compact spectrometer for two-dimensional sampling
US9683891B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 17, 2009 |
| Grant date | Jun 20, 2017 |
| Priority date | — |
| Expiry date | Jul 19, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/453
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrometer for sampling interferograms in two dimensions offering a large spectral band and high spectral resolution with a relative compactness. The spectrometer includes a refracting surface, an array of detecting elements and an array of diffusion elements capturing means at the refracting surface of an interferogram delivered from two interference beams (F1, F2) and forming interference lines parallel to each other along the transverse axis (Ox) of the interferogram within the plane (xOy) of the refracting surface, the array of detection elements being parallel to the plane of the refracting surface and arranged to detect the spatial distribution of the interferogram, wherein the array is a two-dimensional array over an entirety of which the detections elements are disposed equidistantly, and wherein interference lines exhibit an angular shift with the capturing means.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.