Polarization properties imaging systems
US9683930B2 · kind B2 · utility
3Cited by
11References
11Claims
0Family size
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Key dates
| Filing date | May 20, 2014 |
| Grant date | Jun 20, 2017 |
| Priority date | — |
| Expiry date | May 20, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0683
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.