Patent · US Active

Magnetic field probe and probe head thereof

US9684040B2 · kind B2 · utility

1Cited by

8References

10Claims

0Family size

Assignee

National Taiwan University · TW

Inventors

Yien-Tien Chou · Dashulong, TW
Hsin-Chia Lu · Taipei, TW

Key dates

Filing date	Mar 6, 2014
Grant date	Jun 20, 2017
Priority date	—
Expiry date	Apr 11, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/0076
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A magnetic field probe and a probe head thereof are disclosed herein. The probe head includes an inner metal layer, a shielding unit, and a filtering unit. The inner metal layer receives a magnetic field to be measured. The shielding unit, including a first shielding metal layer and a second shielding metal layer, shields the inner metal layer. The first and the second shielding metal layer are respectively stacked above and below the inner metal layer. The filtering unit, including a first filtering metal layer and a second filtering metal layer, filters out an electric field interfering with the inner metal layer. The first filtering metal layer is stacked between the first shielding metal layer and the inner metal layer. The second filtering metal layer is stacked between the second shielding metal layer and the inner metal layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.