Patent · US Active

Microscopy imaging structure with phase conjugated mirror and the method thereof

US9689797B2 · kind B2 · utility

19Cited by
0References
19Claims
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Key dates

Filing dateOct 15, 2012
Grant dateJun 27, 2017
Priority date
Expiry dateJun 21, 2034

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B5/0059
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention discloses a microscopy imaging structure with phase conjugated mirror and the method thereof. The afore-mentioned imaging structure produces a reverse focusing conjugated probe beam together with an original probe beam. These two probe beams meet at the focal point in the object body to be probed, and an interference pattern is produced. The interval between any two consecutive wave fronts in the interference pattern is then half of the wavelength of the original probe beam, and hence the vertical resolution of the image is improved. The present invention also applies a light modulator module on the probe beam to easily adjust the depth of the focal point of the probe beam and the phase conjugated reverse focusing probe beam in the object body. With the adoption of this invention, the size or position limitation of the target object is eliminated and the imaging resolution is also improved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.