Fully digitally controller for cantilever-based instruments
US9689890B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 6, 2015 |
| Grant date | Jun 27, 2017 |
| Priority date | — |
| Expiry date | Jan 16, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q60/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.