Method for correcting the stacking phenomenon applied to X-ray spectrums acquired using a spectrometric sensor

US9689994B2 · kind B2 · utility

Assignee

• COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES · FR

Inventors

• Jean Rinkel · Fontaine, FR
• Andrea Brambilla · Saint-Égrève, FR
• Jean-Marc Dinten · Val-de-Reuil, FR
• Florent Mougel · Rillieux-la-Pape, FR

Key dates

• Filing date: Nov 30, 2010
• Grant date: Jun 27, 2017
• Expiry date: Mar 19, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G01T1/171
• WIPO field: Environmental technology
• WIPO sector: Chemistry

Abstract

A method correcting a measured spectrum of X radiation, according to a number of channels Nc, each channel i corresponding to an energy range between Ei and Ei+ΔEi, including: determining function δti,j(k) determining size of temporal deviation Δt interval separating two interactions with energy Ei and Ej, stacking of which leads to a detected energy value Ek; determining, from the function δti,j(k), probability function Pi,j(k) that an event counted in a channel k corresponds to a stack of two interactions, respectively of energies Ei and Ej; determining, from the probability function Pi,j(k), a stack spectrum as a part of the measured spectrum that corresponds only to the stacks alone; and calculating or estimating at least a first corrected spectrum, by the difference between the measured spectrum and the stack spectrum.