Extended temperature range mapping process of a furnace enclosure using various device settings
US9696210B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 2014 |
| Grant date | Jul 4, 2017 |
| Priority date | — |
| Expiry date | Oct 20, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10048
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process is provided for mapping temperatures in an enclosure during a combustion process. A device setting of an image-capturing device is provided. An intensity-temperature mapping is generated by performing an intensity-temperature calibration based on an intensity of an image pixel in a field of view (FOV) generated by the image-capturing device, a corresponding temperature measurement, and a selected device setting. Each emitted radiation of selected regions is detected based on a first image in the FOV. At least one region is determined whether the region is poor responsive, based on the intensity-temperature mapping associated with the device setting. The at least one poor responsive region is replaced with acceptable regions unaffected by the saturation from at least one other image captured at a different device setting for higher temperature resolution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.