Patent · US Active

Method and apparatus for manufacturing low temperature poly-silicon film, and low temperature poly-silicon film

US9698012B2 · kind B2 · utility

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7Claims
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Assignee

Inventors

Key dates

Filing dateAug 26, 2014
Grant dateJul 4, 2017
Priority date
Expiry dateJan 16, 2035

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23K2103/56
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Disclosed are a method and an apparatus for manufacturing low temperature poly-silicon film, and a low temperature poly-silicon film. The method includes: providing a substrate; forming an amorphous silicon film; applying different temperatures to different regions of the amorphous silicon film by using an excimer laser annealing method, to change the amorphous silicon film into a molten state; and recrystallizating the amorphous silicon film in the molten state, a region having a lower temperature serving as a starting point, a region having a higher temperature serving as an end point, to form a low temperature poly-silicon film. The low temperature poly-silicon film manufactured by the above method and apparatus has a greater size of the crystalline grain and a larger electronic mobility than in the existing technology.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.