Error correction code unit, self-test method and associated controller applied to flash memory device for generating soft information
US9703627B2 · kind B2 · utility
2Cited by
1References
16Claims
0Family size
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Key dates
| Filing date | Nov 23, 2014 |
| Grant date | Jul 11, 2017 |
| Priority date | — |
| Expiry date | Jun 15, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/50004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A self-test method of a flash memory device includes: generating input data; encoding the input data to generate an error correction code; utilizing the input data and the error correction code to simulate to read a page of a flash memory of the flash memory device to generate soft information; and decoding the soft information to generate a decoding result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.