Method of sampling feature points, image matching method using the same, and image matching apparatus
US9704063B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 2014 |
| Grant date | Jul 11, 2017 |
| Priority date | — |
| Expiry date | Mar 26, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/757
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of sampling feature points, an image matching method using the same, and an image matching processor are disclosed. The method of sampling feature points for image matching includes: dividing a first image into a plurality of regions corresponding to a number of feature points to be sampled; extracting a sampled feature point from each of the regions such that a distance between a sampled feature point of one region and a sampled feature point of another region satisfies a predetermined condition; and estimating a homography on the basis of the extracted sampled feature points and corresponding sampled feature points of a second image to be matched with the first image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.