Patent · US Active

Beam profiler

US9709438B2 · kind B2 · utility

2Cited by

4References

16Claims

0Family size

Assignee

M SQUARED LASERS LIMITED · GB

Inventor

Gordon Robertson · Elkton, US

Key dates

Filing date	Nov 13, 2013
Grant date	Jul 18, 2017
Priority date	—
Expiry date	Dec 12, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01J2001/4261
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An M2 value beam profiling apparatus and method is described. The M2 value beam profiler comprises an optical axis defined by a focussing lens assembly and a detector, wherein the focussing lens acts to create an artificial waist within an optical field propagating along the optical axis. The beam profiler also comprises a multiple blade assembly having a first set of blades located at an artificial waist position and a second set of blades longitudinally separated along the optical axis from the artificial waist position. The multiple blade assembly therefore provides a means for selectively passing the blades through the location of the optical axis. Employing these measured widths allows for the M2 value of the optical field to be determined.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.