System and method for measuring an object using X-ray projections
US9709513B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 22, 2015 |
| Grant date | Jul 18, 2017 |
| Priority date | — |
| Expiry date | Sep 22, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/645
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method of measuring an object (having at least two edges) projects a plurality of x-ray images of the object. At least two of the plurality of x-ray images are projected from different directions relative to the object. The apparatus and method also locate the at least two edges in the x-ray images, and ray trace a plurality of lines. Each ray traced line is tangent to at least one point on at least one of the located edges. Next, the apparatus and method reconstruct at least a partial wireframe model of the object from the tangent points of the ray traced lines. The wireframe model includes the at least two edges. Finally, the apparatus and method measure between the at least two edges of the at least partial wireframe model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.