X-ray backscatter system and method for detecting discrepancies in items
US9709514B2 · kind B2 · utility
2Cited by
10References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 2, 2012 |
| Grant date | Jul 18, 2017 |
| Priority date | — |
| Expiry date | Oct 25, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/652
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.