Patent · US Active

Scanning ion conductance microscopy using surface roughness for probe movement

US9709598B2 · kind B2 · utility

1Cited by

6References

22Claims

0Family size

Assignee

IMPERIAL INNOVATIONS LIMITED · GB

Inventors

Pavel Novak · Munich, DE
Chao Li · Franklin, US
Andrew Shevchuk · London, GB
Victor Petrovich Ostanin · Cambridge, GB
David Klenerman · Stanford-le-Hope, GB
Yuri Evgenievich Korchev · London, GB
Gregory Frolenkov · Lexington, US
Richard H. Clarke · Boston, US

Key dates

Filing date	May 27, 2016
Grant date	Jul 18, 2017
Priority date	—
Expiry date	May 27, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01Q10/065
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for interrogating a surface using scanning ion conductance microscopy (SICM), comprising the steps of:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.