System and method to map defect reduction data to organizational maturity profiles for defect projection modeling
US9710257B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | Apr 14, 2015 |
| Grant date | Jul 18, 2017 |
| Priority date | — |
| Expiry date | Apr 15, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to receive a maturity level for an organization and select at least one defect analysis starter/defect reduction method (DAS/DRM) defect profile based on the maturity level. Additionally, the programming instructions are operable to determine a projection analysis for one or more stages of the life cycle of a software code project of the organization based on the at least one DAS/DRM defect profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.