Semiconductor strain gauge
US9714876B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2015 |
| Grant date | Jul 25, 2017 |
| Priority date | — |
| Expiry date | Jul 2, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R17/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for a semiconductor strain gauge pressure sensor. An apparatus includes a sense element configured to be exposed to a pressure environment, the sense element including at least one highly doped semiconductor strain gauge, the highly doped semiconductor strain gauge including a five pad single full Wheatstone bridge, an electronics package disposed on a carrier and electrically coupled to the sense element, the carrier disposed on a port that comprises the sense element, a housing disposed about the sense element and electronics package, and a connector joined to the housing and electrically connected to the electronics package, the connector including an external interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.