Modular data storage device testing system
US9715896B2 · kind B2 · utility
5Cited by
20References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 8, 2016 |
| Grant date | Jul 25, 2017 |
| Priority date | — |
| Expiry date | Aug 8, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B25/043
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.