Patent · US Active

Data storage component test deck

US9715897B2 · kind B2 · utility

2Cited by

14References

20Claims

0Family size

Assignee

Seagate Technology LLC · US

Inventors

Michael Louis Rancour · Minnetonka, US
Brett R. Herdendorf · Mound, US
Ronald Eldon Anderson · Melbourne, AU

Key dates

Filing date	Aug 18, 2016
Grant date	Jul 25, 2017
Priority date	—
Expiry date	Aug 18, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG11B33/00
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A test deck may be employed as part of a data storage component testing system. A test deck can consist of at least a bottom cover mating to a top cover to define an enclosed testing region configured to house a data storage medium, transducing head, and head suspension. The top cover may have an access port occupied by a door providing access to the enclosed testing region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.