Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging

US9717470B2 · kind B2 · utility

Assignee

• KONINIKLIJKE PHILIPS N.V. · NL

Inventors

• Gerhard Martens · Henstedt-Ulzburg, DE
• Heiner Daerr · Hamburg, DE
• Thomas Detlef Istel · Hamburg, DE
• Ewald Roessl · Ellerau, DE
• Udo Van Stevendaal · Ahrensburg, DE

Key dates

• Filing date: Aug 20, 2013
• Grant date: Aug 1, 2017
• Expiry date: Apr 15, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/643
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An X-ray imaging method includes acquiring a differential phase contrast imaging X-ray scan with an X-ray imaging system having an X-ray source, an X-ray detector, and a grating arrangement having a source grating, a phase grating and an analyzer grating. The source grating is misaligned in respect to an interferometer such that moiré fringes are detectable in the plane of the detector. A translation signal is computed for translating the source grating for achieving a predetermined moiré pattern. The positioning of the source grating is adjusted in an X-ray projection direction based on the translation signal such that at least 2 pi of phase changes are covered with the Moiré fringes over the width of the detector. And a further differential phase contrast imaging X-ray scan is acquired.